Plasma processes for depositing low dielectric constant films

ABSTRACT

A method and apparatus for depositing a low dielectric constant film by reaction of an organosilicon compound and an oxidizing gas comprising carbon at a constant RF power level. Dissociation of the oxidizing gas can be increased prior to mixing with the organosilicon compound, preferably within a separate microwave chamber, to assist in controlling the carbon content of the deposited film. The oxidized organosilane or organosiloxane film has good barrier properties for use as a liner or cap layer adjacent other dielectric layers. The oxidized organosilane or organosiloxane film may also be used as an etch stop and an intermetal dielectric layer for fabricating dual damascene structures. The oxidized organosilane or organosiloxane films also provide excellent adhesion between different dielectric layers.

RELATED APPLICATIONS

[0001] This application is a continuation of co-pending U.S. patentapplication Ser. No. 10/229,992, filed on Aug. 27, 2002, which is acontinuation of co-pending U.S. patent application Ser. No. 09/594,186[AMAT/3032.C2], filed on Jun. 13, 2000, now issued as U.S. Pat. No.6,562,690, which is a continuation of co-pending U.S. patent applicationSer. No. 09/185,555 [AMAT/3032.P1], filed on Nov. 4, 1998, now issued asU.S. Pat. No. 6,303,523, which was a continuation-in-part of co-pendingU.S. patent application Ser. No. 09/021,788 [AMAT/2592], filed on Feb.11, 1998, now issued as U.S. Pat. No.6,054,379, a continuation-in-partof co-pending U.S. patent application Ser. No. 09/114,682[AMAT/2592.01], filed on Jul. 13, 1998, now issued as U.S. Pat. No.6,072,227, and a continuation-in-part of co-pending U.S. patentapplication Ser. No. 09/162,915 [AMAT/3032], filed on Sep. 29, 1998, nowissued as U.S. Pat. No. 6,287,990.

BACKGROUND OF THE DISCLOSURE

[0002] 1. Field of the Invention

[0003] The present invention relates to the fabrication of integratedcircuits. More particularly, the invention relates to a process andapparatus for depositing dielectric layers on a substrate.

[0004] 2. Background of the Invention

[0005] One of the primary steps in the fabrication of modernsemiconductor devices is the formation of metal and dielectric films ona substrate by chemical reaction of gases. Such deposition processes arereferred to as chemical vapor deposition or CVD. Conventional thermalCVD processes supply reactive gases to the substrate surface whereheat-induced chemical reactions take place to produce a desired film.The high temperatures at which some thermal CVD processes operate candamage device structures having layers previously formed on thesubstrate. A preferred method of depositing metal and dielectric filmsat relatively low temperatures is plasma-enhanced CVD (PECVD) techniquessuch as described in U.S. Pat. No. 5,362,526, entitled “Plasma-EnhancedCVD Process Using TEOS for Depositing Silicon Oxide”, which isincorporated by reference herein. Plasma-enhanced CVD techniques promoteexcitation and/or disassociation of the reactant gases by theapplication of radio frequency (RF) energy to a reaction zone near thesubstrate surface, thereby creating a plasma of highly reactive species.The high reactivity of the released species reduces the energy requiredfor a chemical reaction to take place, and thus lowers the requiredtemperature for such PECVD processes.

[0006] Semiconductor device geometries have dramatically decreased insize since such devices were first introduced several decades ago. Sincethen, integrated circuits have generally followed the two year/half-sizerule (often called Moore's Law), which means that the number of devicesthat will fit on a chip doubles every two years. Today's fabricationplants are routinely producing devices having 0.35 μm and even 0.18 μmfeature sizes, and tomorrow's plants soon will be producing deviceshaving even smaller geometries.

[0007] In order to further reduce the size of devices on integratedcircuits, it has become necessary to use conductive materials having lowresistivity and insulators having low k (dielectric constant<4.0) toreduce the capacitive coupling between adjacent metal lines.Liner/barrier layers have been used between the conductive materials andthe insulators to prevent diffusion of byproducts such as moisture ontothe conductive material as described in International Publication NumberWO 94/01885. For example, moisture that can be generated duringformation of a low k insulator readily diffuses to the surface of theconductive metal and increases the resistivity of the conductive metalsurface. A barrier/liner layer formed from conventional silicon oxide orsilicon nitride materials can block the diffusion of the byproducts.However, the barrier/liner layers typically have dielectric constantsthat are significantly greater than 4.0, and the high dielectricconstants result in a combined insulator that does not significantlyreduce the dielectric constant.

[0008]FIG. 1A illustrates a PECVD process for depositing a barrier/linerlayer as described in International Publication Number WO 94/01885. ThePECVD process deposits a multi-component dielectric layer wherein asilicon dioxide (SiO₂) liner layer 2 is first deposited on a patternedmetal layer having metal lines 3 formed on a substrate 4. The linerlayer 2 is deposited by a plasma enhanced reaction of silane (SiH₄) andnitrous oxide (N₂O) at 300° C. A self-planarizing low k dielectric layer5 is then deposited on the liner layer 2 by reaction of a silanecompound and a peroxide compound. The self-planarizing layer 5 retainsmoisture that is removed by curing. The liner layer 2 is an oxidizedsilane film that has effective barrier properties when deposited in amanner which provides a dielectric constant of at least 4.5. Thedielectric constant of the oxidized silane film can be decreased toabout 4.1 by altering process conditions in a manner that decreasesmoisture barrier properties of the film. Conventional liner layers, suchas SiN, have even higher dielectric constants, and the combination oflow k dielectric layers with high k dielectric liner layers can providelittle or no improvement in the overall stack dielectric constant andcapacitive coupling.

[0009] As shown in FIG. 1B, WO 94/01885 further describes an optionalSiO₂ cap layer 6 that is deposited on the low k dielectric layer 5 bythe reaction of silane and N₂O. The cap layer 6 is also an oxidizedsilane film that has good barrier properties when deposited in a mannerthat provides a dielectric constant of about 4.5. Both the liner layer 2and the cap layer 6 have a dielectric constant greater than 4.5 and thehigh dielectric constant layers substantially detract from the benefitof the low k dielectric layer 5.

[0010] As devices get smaller, liner layers and cap layers having highdielectric constants contribute more to the overall dielectric constantof a multi-component dielectric layer. Furthermore, known low kdielectric materials generally have low oxide content which makes thematerial inadequate as an etch stop layer during etching of vias and/orinterconnects. Silicon nitride has been the etch stop material of choicefor making interconnect lines in low k dielectric materials. However,the silicon nitride has a relatively high dielectric constant(dielectric constant of about 7) compared to the surrounding low kdielectric layers. It has also been discovered that the silicon nitridemay significantly increase the capacitive coupling between interconnectlines, even when an otherwise low k dielectric material is used as theprimary insulator. This may lead to crosstalk and/orresistance-capacitance (RC) delay that degrades the overall performanceof the device. Thus, the silicon nitride etch stop layers are typicallyremoved after etching of the underlying dielectric layers.

[0011] Ideally, a low k dielectric layer having both good barrierproperties for use as a liner layer and sufficient oxide content for useas an etch stop could be identified and deposited in the same chambersas existing low k dielectric materials. Such barrier layers would notincrease the overall dielectric constant of the dielectric layers, andsuch an etch stop layer would not have to be removed after etching theunderlying layers.

[0012] U.S. Pat. No. 5,554,570 describes barrier layers for use withthermal CVD silicon oxides wherein an organosilane having a C—H group isoxidized instead of silane to increase the density of deposited filmsand to improve adhesion between the layers. For example, a thermal CVDlayer produced from tetraethoxysilane (TEOS) and ozone, may be depositedbetween PECVD silicon oxide films produced from an organosilicon and N₂Oor O₂.

[0013] The barrier layers described in the '570 patent are preferablydense silicon oxide layers having low carbon contents. The dense layersare deposited using 400 W of high frequency RF power although the use oflow frequency RF power is asserted to improve film stress. The barrierlayers are preferably produced from alkoxysilanes or chlorinatedalkylsilanes and N₂O to reduce carbon content and increase the densityof the layers.

[0014] The '570 patent does not identify process conditions for makingbarrier layers having low dielectric constants or for making etch stoplayers having high oxide contents. The '570 patent also does not suggestuse of the described layers as a barrier layer adjacent a low kdielectric layer or as an etch stop.

[0015] There remains a need for dielectric layers having low dielectricconstants, good barrier properties, and high oxide content for use asbarrier layers or etch stop layers in sub-micron devices.

SUMMARY OF THE INVENTION

[0016] The present invention provides a method and apparatus fordepositing a silicon oxide layer having a low dielectric constant. Thesilicon oxide layer is produced by plasma assisted chemical vapordeposition of an organosilane, an organosiloxane, or combinationsthereof, using RF or microwave power to generate reactive oxygen atoms.The properties of the silicon oxide layers are readily controlled byprocess variations, and different layers can be deposited in onedeposition chamber as shown for an improved dual damascene process. Inaddition, the silicon oxide layers can be used as an adhesive layerbetween different layers, or as an intermetal dielectric layer. Apreferred silicon oxide layer is produced by reaction of nitrous oxide,N₂O, and a silicon compound containing Si—H bonds, such as methylsilane,CH₃SiH₃, or dimethylsilane, (CH₃)₂SiH₂.

[0017] The silicon oxide layers are cured at low pressure and hightemperature to stabilize properties. The silicon oxide layers are mostpreferably produced using separate applications of RF power to thedeposition chamber to increase porosity of the deposited layers. The useof low levels of RF power is preferred at chamber pressures less thanabout 10 Torr. Microwave power is preferably provided to oxidizing gasesin a dissociation chamber to control formation of reactive oxidizerswithout increasing the power level in the deposition chamber.

[0018] In a preferred embodiment, a silicon oxide layer is deposited ona patterned metal layer by plasma assisted reaction of one or moreorganosilane and/or organosiloxane compounds that include Si—H bonds.

[0019] The silicon oxide of the present invention has further utility inan integrated process for manufacture of reliable dual damascenestructures in one deposition chamber to reduced capacitive couplingbetween interconnect lines. In a preferred embodiment, a low kdielectric film having high carbon content, greater than about 20% byatomic weight, is deposited as a via level dielectric layer. A low kdielectric film having a low carbon content, less than about 10% byatomic weight, is then deposited on the high carbon layer to form atrench level dielectric layer. A dual damascene etch then forms thetrenches in the trench level dielectric layer and stops at the via leveldielectric layer. After etching the vias in the via level dielectriclayer, the upper surface is then planarized to leave a planar surface onthe trench level dielectric layer.

[0020] The invention further provides an intermetal dielectric material(IMD) comprising the silicon oxide which is deposited on a conventionaletch stop such as silicon oxide or silicon nitride. The silicon oxidecan also be deposited as a thin adhesive layer.

BRIEF DESCRIPTION OF THE DRAWINGS

[0021] So that the manner in which the above recited features,advantages and objects of the present invention are attained and can beunderstood in detail, a more particular description of the invention,briefly summarized above, may be had by reference to the embodimentsthereof which are illustrated in the appended drawings.

[0022] It is to be noted, however, that the appended drawings illustrateonly typical embodiments of this invention and are therefore not to beconsidered limiting of its scope, for the invention may admit to otherequally effective embodiments.

[0023] FIGS. 1A-1B (Prior Art) are schematic diagrams of dielectriclayers deposited on a substrate by the processes known in the art;

[0024]FIG. 2 is a cross-sectional diagram of an exemplary CVD plasmareactor configured for use according to the present invention;

[0025]FIG. 3 is a diagram of the system monitor of the CVD plasmareactor of FIG. 2;

[0026]FIG. 4 is a flow chart of a process control computer programproduct used in conjunction with the exemplary CVD plasma reactor ofFIG. 2;

[0027]FIG. 5 is a flow chart illustrating steps undertaken in depositingliner and cap layers in a gap filling process according to oneembodiment of the present invention;

[0028] FIGS. 6A-6E is a schematic diagram of the layers deposited on asubstrate by the process of FIG. 5;

[0029]FIG. 7 is a cross sectional view showing a dual damascenestructure comprising the silicon oxide layers of the present invention;

[0030] FIGS. 8A-8H are cross sectional views showing one embodiment of adual damascene deposition sequence of the present invention;

[0031]FIG. 9 is a cross sectional view showing an adhesive layercomprising the silicon oxide layer of the present invention between apremetal dielectric layer and an intermetal dielectric layer;

[0032] FIGS. 10A-10H are cross sectional views showing a dual damascenedeposition sequence wherein the silicon oxide of the present inventionis used to adhere an intermetal dielectric film to a conventional etchstop; and

[0033] FIGS. 11A-11D are cross sectional views showing an integrateddual damascene deposition sequence wherein the silicon oxide of thepresent invention is used to eliminate a conventional etch stop.

[0034] For a further understanding of the present invention, referenceshould be made to the ensuing detailed description.

DESCRIPTION OF A PREFERRED EMBODIMENT

[0035] The present invention provides a method and apparatus fordepositing a silicon oxide layer having a low dielectric constant, ahigh oxide content, and sufficient carbon content to provide barrierproperties. The silicon oxide layer comprises an oxidized organosilaneor organosiloxane and can be used as a lining layer adjacent otherdielectric materials, as an etch stop layer adjacent dielectricmaterials having lower oxide content, as an intermetal dielectric layer,and as an adhesion layer between different materials. The oxidizedorganosilane material is deposited by plasma assisted oxidation of theorganosilane or organosiloxane compounds using from about 10 W to about200 W of constant RF power, or from about 20 W to about 500 W of pulsedRF power. The silicon oxide layer can also be deposited using frequentbreaks, such as changing chambers or providing cooling time, to improveporosity. The RF power is preferably provided at a high frequency suchas between 13 MHz and 14 MHz. The RF power is preferably provided inshort duration cycles wherein the power is on at the stated levels forcycles less than about 200 Hz and the on cycles total from about 10% toabout 30% of the total duty cycle. Intermittent RF power can operate athigher peak power levels and provide the same total power input asconstant RF power at a lower power level.

[0036] Carbon which remains in the silicon oxide layer contributes tolow dielectric constants and barrier properties. The remaining carbon isbetween about 1% and about 50% by atomic weight, and preferably includessufficient C—H or C—F bonds to provide hydrophobic properties to thesilicon oxide layer resulting in significantly lower dielectricconstants and improved moisture barrier properties.

[0037] The silicon oxide layers are produced from silicon compounds thatinclude carbon in organo groups that are not readily removed byoxidation at processing conditions. Preferably the —C—H bonds areincluded such as in alkyl or aryl groups, or fluorinated carbonderivatives thereof. Suitable organo groups also can include alkenyl andcyclohexenyl groups and functional derivatives. The organo siliconcompounds include: methylsilane, CH₃—SiH₃ dimethylsilane, (CH₃)₂—SiH₂trimethylsilane, (CH₃)₃—SiH dimethylsilanediol, (CH₃)₂—Si—(OH)₂ethylsilane, CH₃—CH₂—SiH₃ phenylsilane, C₆H₅—SiH₃ diphenylsilane,(C₆H₅)₂—SiH₂ diphenylsilanediol, (C₆H₅)₂—Si—(OH)₃ methylphenylsilane,C₆H₅—SiH₂—CH₃ disilanomethane, SiH₃—CH₂—SiH₃ bis(methylsilano)methane,CH₃—SiH₂—CH₂—SiH₂—CH₃ 1,2-disilanoethane, SiH₃—CH₂—CH₂—SiH₃1,2-bis(methylsilano)ethane, CH₃—SiH₂—CH₂—CH₂—SiH₂—CH₃2,2-disilanopropane, SiH₃—C(CH₃)₂—SiH₃ 1,3,5-trisilano-2,4,6-SiH₂CH₂₃ (cyclic) trimethylene, 1,3-dimethyldisiloxane,CH₃—SiH₂—O—SiH₂—CH₃ 1,1,3,3-tetramethyldisiloxane,(CH₃)₂—SiH—O—SiH—(CH₃)₂ hexamethyldisiloxane, (CH₃)₃—Si—O—Si—(CH₃)₃ 1,3-(SiH₃—CH₂—SiH₂₂O bis(silanomethylene)disiloxane, bis(1-(CH₃—SiH₂—O—SiH₂₂CH₂ methyldisiloxanyl)methane, 2,2-bis(1-(CH₃—SiH₂—O—SiH₂₂C(CH₃)₂ methyldisiloxanyl)propane, 1,3,5,7-SiHCH₃—O₄ (cyclic) tetramethylcyclotetrasiloxane,octamethylcyclotetrasiloxane, Si(CH₃)₂—O₄ (cyclic) and 1,3,5,7,9-SiHCH₃—O₅ (cyclic) pentamethylcyclopentasiloxane,1,3,5,7-tetrasilano-2,6- SiH₂—CH₂SiH₂—O₂ (cyclic)dioxy-4,8-dimethylene,

[0038] The organo silicon compounds are oxidized during deposition byreaction with oxygen (O₂) or oxygen containing compounds such as nitrousoxide (N₂O), ozone (O₃), carbon dioxide (CO₂), and water (H₂O),preferably N₂O, such that the carbon content of the deposited film isfrom 1 to 50% by atomic weight, preferably about 5 to 30%. The oxidizedorgano silicon layer has a dielectric constant of about 3.0 and hasexcellent barrier properties. The oxidized organo silicon layers furtherhave high oxide contents in comparison to conventional low k dielectriclayers and good adhesion properties.

[0039] Oxygen and oxygen containing compounds are preferably dissociatedto increase reactivity when necessary to achieve a desired carboncontent in the deposited film. RF power can be coupled to the depositionchamber to increase dissociation of the oxidizing compounds. Theoxidizing compounds may also be dissociated in a microwave chamber priorto entering the deposition chamber to reduce excessive dissociation ofthe silicon containing compounds. Deposition of the silicon oxide layercan be continuous or discontinuous. Although deposition preferablyoccurs in a single deposition chamber, the layer can be depositedsequentially in two or more deposition chambers. Furthermore, RF powercan be cycled or pulsed to reduce heating of the substrate and promotegreater porosity in the deposited film.

[0040] The organosilane and organosiloxane compounds preferably includethe structures:

[0041] wherein each Si is bonded to one or two carbon atoms, and C isincluded in an organo group, preferably alkyl or alkenyl groups such as—CH₃, —CH₂—CH₃, —CH₂—, or —CH₂—CH₂—, or fluorinated carbon derivativesthereof. The carbon atoms in the fluorinated derivatives may bepartially or fully fluorinated to replace hydrogen atoms. When anorganosilane or organosiloxane compound includes two or more Si atoms,each Si is separated from another Si by O, C, or —C—C—, wherein C isincluded in an organo group, preferably alkyl or alkenyl groups such asCH₂, CH₂CH₂, CH(CH₃) or C(CH₃)₂, or fluorinated derivatives thereof. Thepreferred organosilane and organosiloxane compounds are gases or liquidsnear room temperature and can be volatilized above about 10 Torr.Preferred organosilanes and organosiloxanes include: methylsilane,CH₃—SiH₃ dimethylsilane, (CH₃)₂—SiH₂ trimethylsilane, (CH₃)₃—SiHdisilanomethane, SiH₃—CH₂—SiH₃ bis(methylsilano)methane,CH₃—SiH₂—CH₂—SiH₂—CH₃ 1,2-disilanoethane, SiH₃—CH₂—CH₂—SiH₃1,2-bis(methylsilano)ethane, CH₃—SiH₂—CH₂—CH₂—SiH₂—CH₃2,2-disilanopropane, SiH₃—C(CH₃)₂—SiH₃ 1,3,5-trisilano-2,4,6-SiH₂CH₂₃ (cyclic) trimethylene, 1,3-dimethyldisiloxane,CH₃—SiH₂—O—SiH₂—CH₃ 1,3- (SiH₃—CH₂—SiH₂₂Obis(silanomethylene)disiloxane, bis(1- (CH₃—SiH₂—O—SiH₂₂CH₂methyldisiloxanyl)methane, 2,2-bis(1- (CH₃—SiH₂—O—SiH₂₂C(CH₃)₂methyldisiloxanyl)propane, 1,3,5,7- SiHCH₃—O₄ (cyclic)tetramethylcyclotetrasiloxane, 1,3,5,7,9- SiHCH₃—O₅ (cyclic)pentamethylcyclopentasiloxane, and 1,3,5,7-tetrasilano-2,6-dioxy-SiH₂—CH₂—SiH₂—O₂ (cyclic) 4,8-dimethylene, and fluorinated carbonderivatives thereof, such as: 1,2-disilanotetrafluoroethane.SiH₃—CF₂—CF₂—SiH₃

[0042] The hydrocarbon groups in the organosilanes and organosiloxanemay be partially or fully fluorinated to convert C—H bonds to C—F bonds.Many of the preferred organosilane and organosiloxane compounds arecommercially available. A combination of two or more of theorganosilanes or organosiloxanes can be employed to provide a blend ofdesired properties such as dielectric constant, oxide content,hydrophobicity, film stress, and plasma etching characteristics.

[0043] The organosilane and organosiloxane compounds are preferablyoxidized during deposition by plasma assisted reaction with oxygen whichis formed during the deposition process by decomposition of nitrousoxide (N₂O). Nitrous oxide does not react with the organosilanes ororganosiloxanes without plasma assistance, and the oxygen-nitrogen bondsare readily broken at lower energies than the bonds in the organosilanesand organosiloxanes. The oxidized compounds adhere to contacted surfacessuch as a patterned layer of a semiconductor substrate to form adeposited film. The deposited films are cured at low pressure and attemperatures from about 100 to about 450° C., preferably above about400° C. to stabilize the barrier properties of the films. The depositedfilm has sufficient carbon content to provide barrier properties. Thecarbon content preferably includes C—H or C—F bonds to provide ahydrophobic film that is an excellent moisture barrier.

[0044] The present invention further provides a substrate processingsystem having a vessel including a reaction zone, a substrate holder forpositioning a substrate in the reaction zone, and a vacuum system. Theprocessing system further comprises a gas/liquid distribution systemconnecting the reaction zone of the vessel to supplies of anorganosilane or organosiloxane compound, an oxidizing gas, and an inertgas, and an RF generator coupled to the gas distribution system forgenerating a plasma in the reaction zone. The processing system furthercomprises a controller comprising a computer for controlling the vessel,the gas distribution system, and the RF generator, and a memory coupledto the controller, the memory comprising a computer usable mediumcomprising a computer readable program code for selecting the processsteps of depositing a low dielectric constant film with a plasma of anorganosilane or organosiloxane compound and an oxidizing gas.

[0045] The processing system may further comprise in one embodimentcomputer readable program code for selecting the process steps ofdepositing a liner of the oxidized organo silicon compound, depositing adifferent dielectric layer, and optionally depositing a capping layer ofthe oxidized organo silicon compound.

[0046] Further description of the invention relates to a specificapparatus for depositing silicon oxide layers of the present inventionand to preferred silicon oxide films.

Exemplary CVD Plasma Reactor

[0047] One suitable CVD plasma reactor in which a method of the presentinvention can be carried out is shown in FIG. 2, which is a vertical,cross-section view of a parallel plate chemical vapor deposition reactor10 having a high vacuum region 15. Reactor 10 contains a gasdistribution manifold 11 for dispersing process gases through perforatedholes in the manifold to a substrate or wafer (not shown) that rests ona substrate support plate or susceptor 12 which is raised or lowered bya lift motor 14. A liquid injection system (not shown), such astypically used for liquid injection of TEOS, may also be provided forinjecting a liquid organosilane and/or organosiloxane compound. Thepreferred methylsilanes are gases.

[0048] The reactor 10 includes heating of the process gases andsubstrate, such as by resistive heating coils (not shown) or externallamps (not shown). Referring to FIG. 2, susceptor 12 is mounted on asupport stem 13 so that susceptor 12 (and the wafer supported on theupper surface of susceptor 12) can be controllably moved between a lowerloading/off-loading position and an upper processing position which isclosely adjacent to manifold 11.

[0049] When susceptor 12 and the wafer are in processing position 14,they are surrounded by a an insulator 17 and process gases exhaust intoa manifold 24. During processing, gases inlet to manifold 11 areuniformly distributed radially across the surface of the wafer. A vacuumpump 32 having a throttle valve controls the exhaust rate of gases fromthe chamber.

[0050] Before reaching manifold 11, deposition and carrier gases areinput through gas lines 18 into a mixing system 19 where they arecombined and then sent to manifold 11. An optional microwave applicator28 can be located on the input gas line for the oxidizing gas to provideadditional energy that dissociates only the oxidizing gas. The microwaveapplicator provides from 0 to 6000 W. Generally, the process gasessupply line 18 for each of the process gases also includes (i) safetyshut-off valves (not shown) that can be used to automatically ormanually shut off the flow of process gas into the chamber, and (ii)mass flow controllers (also not shown) that measure the flow of gasthrough the gas supply lines. When toxic gases are used in the process,several safety shut-off valves are positioned on each gas supply line inconventional configurations.

[0051] The deposition process performed in reactor 10 can be either athermal process or a plasma enhanced process. In a plasma process, acontrolled plasma is typically formed adjacent to the wafer by RF energyapplied to distribution manifold 11 from RF power supply 25 (withsusceptor 12 grounded). Alternatively, RF power can be provided to thesusceptor 12 or RF power can be provided to different components atdifferent frequencies. RF power supply 25 can supply either single ormixed frequency RF power to enhance the decomposition of reactivespecies introduced into the high vacuum region 15. A mixed frequency RFpower supply typically supplies power at a high RF frequency (RF1) of13.56 MHz to the distribution manifold 11 and at a low RF frequency(RF2) of 360 KHz to the susceptor 12. The silicon oxide layers of thepresent invention are most preferably produced using low levels ofconstant high frequency RF power or pulsed levels of high frequency RFpower. Pulsed RF power preferably provides 13.56 MHz RF power at about20 W to about 500 W, most preferably from 20 W to about 250 W, duringabout 10% to about 30% of the duty cycle. Constant RF power preferablyprovides 13.56 MHz RF power at about 10 W to about 200 W, preferablyfrom about 20 W to about 100 W. Low power deposition preferably occursat a temperature range from about −20° C. to about 40° C. At thepreferred temperature range, the deposited film is partially polymerizedduring deposition and polymerization is completed during subsequentcuring of the film.

[0052] When additional dissociation of the oxidizing gas is desired, anoptional microwave chamber can be used to input from 0 to 3000 W ofmicrowave power to the oxidizing gas prior to entering the depositionchamber. Separate addition of microwave power would avoid excessivedissociation of the silicon compounds prior to reaction with theoxidizing gas. A gas distribution plate having separate passages for thesilicon compound and the oxidizing gas is preferred when microwave poweris added to the oxidizing gas.

[0053] Typically, any or all of the chamber lining, distributionmanifold 11, susceptor 12, and various other reactor hardware is madeout of material such as aluminum or anodized aluminum. An example ofsuch a CVD reactor is described in U.S. Pat. No. 5,000,113, entitled AThermal CVD/PECVD Reactor and Use for Thermal Chemical Vapor Depositionof Silicon Dioxide and In-situ Multi-step Planarized Process, issued toWang et al. and assigned to Applied Materials, Inc., the assignee of thepresent invention.

[0054] The lift motor 14 raises and lowers susceptor 12 between aprocessing position and a lower, wafer-loading position. The motor, thegas mixing system 19, and the RF power supply 25 are controlled by asystem controller 34 over control lines 36. The reactor includes analogassemblies, such as mass flow controllers (MFCs) and standard or pulsedRF generators, that are controlled by the system controller 34 whichexecutes system control software stored in a memory 38, which in thepreferred embodiment is a hard disk drive. Motors and optical sensorsare used to move and determine the position of movable mechanicalassemblies such as the throttle valve of the vacuum pump 32 and motorfor positioning the susceptor 12.

[0055] The system controller 34 controls all of the activities of theCVD reactor and a preferred embodiment of the controller 34 includes ahard disk drive, a floppy disk drive, and a card rack. The card rackcontains a single board computer (SBC), analog and digital input/outputboards, interface boards and stepper motor controller boards. The systemcontroller conforms to the Versa Modular Europeans (VME) standard whichdefines board, card cage, and connector dimensions and types. The VMEstandard also defines the bus structure having a 16-bit data but and24-bit address bus.

[0056] The system controller 34 operates under the control of a computerprogram stored on the hard disk drive 38. The computer program dictatesthe timing, mixture of gases, RF power levels, susceptor position, andother parameters of a particular process. The interface between a userand the system controller is via a CRT monitor 40 and light pen 44 whichare depicted in FIG. 3. In the preferred embodiment a second monitor 42is used, the first monitor 40 being mounted in the clean room wall forthe operators and the other monitor 42 behind the wall for the servicetechnicians. Both monitors 40, 42 simultaneously display the sameinformation but only one light pen 44 is enabled. The light pen 44detects light emitted by CRT display with a light sensor in the tip ofthe pen. To select a particular screen or function, the operator touchesa designated area of the display screen and pushes the button on the pen44. The touched area changes its highlighted color, or a new menu orscreen is displayed, confirming communication between the light pen andthe display screen.

[0057] Referring to FIG. 4, the process can be implemented using acomputer program product 410 that runs on, for example, the systemcontroller 34. The computer program code can be written in anyconventional computer readable programming language such as for example68000 assembly language, C, C++, or Pascal. Suitable program code isentered into a single file, or multiple files, using a conventional texteditor, and stored or embodied in a computer usable medium, such as amemory system of the computer. If the entered code text is in a highlevel language, the code is compiled, and the resultant compiler code isthen linked with an object code of precompiled windows library routines.To execute the linked compiled object code, the system user invokes theobject code, causing the computer system to load the code in memory,from which the CPU reads and executes the code to perform the tasksidentified in the program.

[0058]FIG. 4 shows an illustrative block diagram of the hierarchicalcontrol structure of the computer program 410. A user enters a processset number and process chamber number into a process selector subroutine420 in response to menus or screens displayed on the CRT monitor 40 byusing the light pen 44 interface. The process sets are predeterminedsets of process parameters necessary to carry out specified processes,and are identified by predefined set numbers. The process selectorsubroutine 420 the (i) selects a desired process chamber on a clustertool such as an Centura® platform (available from Applied Materials,Inc.), and (ii) selects a desired set of process parameters needed tooperate the process chamber for performing the desired process. Theprocess parameters for performing a specific process relate to processconditions such as, for example, process gas composition and flow rates,temperature, pressure, plasma conditions such as RF bias power levelsand magnetic field power levels, cooling gas pressure, and chamber walltemperature and are provided to the user in the form of a recipe. Theparameters specified by the recipe are entered utilizing the lightpen/CRT monitor interface.

[0059] The signals for monitoring the process are provided by the analoginput and digital input boards of system controller and the signals forcontrolling the process are output on the analog output and digitaloutput boards of the system controller 34.

[0060] A process sequencer subroutine 430 comprises program code foraccepting the identified process chamber and set of process parametersfrom the process selector subroutine 420, and for controlling operationof the various process chambers. Multiple users can enter process setnumbers and process chamber numbers, or a user can enter multipleprocess chamber numbers, so the sequencer subroutine 430 operates toschedule the selected processes in the desired sequence. Preferably thesequencer subroutine 430 includes computer readable program code toperform the steps of (i) monitoring the operation of the processchambers to determine if the chambers are being used, (ii) determiningwhat processes are being carried out in the chambers being used, and(iii) executing the desired process based on availability of a processchamber and type of process to be carried out. Conventional methods ofmonitoring the process chambers can be used, such as polling. Whenscheduling which process is to be executed, the sequencer subroutine 430can be designed to take into consideration the present condition of theprocess chamber being used in comparison with the desired processconditions for a selected process, or the “age” of each particular userentered request, or any other relevant factor a system programmerdesires to include for determining the scheduling priorities.

[0061] Once the sequencer subroutine 430 determines which processchamber and process set combination is going to be executed next, thesequencer subroutine 430 causes execution of the process set by passingthe particular process set parameters to a chamber manager subroutine440 which controls multiple processing tasks in a process chamber 10according to the process set determined by the sequencer subroutine 430.For example, the chamber manager subroutine 440 comprises program codefor controlling CVD process operations in the process chamber 10. Thechamber manager subroutine 440 also controls execution of variouschamber component subroutines which control operation of the chambercomponent necessary to carry out the selected process set. Examples ofchamber component subroutines are susceptor control subroutine 450,process gas control subroutine 460, pressure control subroutine 470,heater control subroutine 480, and plasma control subroutine 490. Thosehaving ordinary skill in the art would readily recognize that otherchamber control subroutines can be included depending on what processesare desired to be performed in the reactor 10.

[0062] In operation, the chamber manager subroutine 440 selectivelyschedules or calls the process component subroutines in accordance withthe particular process set being executed. The chamber managersubroutine 440 schedules the process component subroutines similarly tohow the sequencer subroutine 430 schedules which process chamber 10 andprocess set is to be executed next. Typically, the chamber managersubroutine 440 includes steps of monitoring the various chambercomponents, determining which components needs to be operated based onthe process parameters for the process set to be executed, and causingexecution of a chamber component subroutine responsive to the monitoringand determining steps.

[0063] Operation of particular chamber component subroutines will now bedescribed with reference to FIG. 4. The susceptor control positioningsubroutine 450 comprises program code for controlling chamber componentsthat are used to load the substrate onto the susceptor 12, andoptionally to lift the substrate to a desired height in the reactor 10to control the spacing between the substrate and the gas distributionmanifold 11. When a substrate is loaded into the reactor 10, thesusceptor 12 is lowered to receive the substrate, and thereafter, thesusceptor 12 is raised to the desired height in the chamber, to maintainthe substrate at a first distance or spacing from the gas distributionmanifold 11 during the CVD process. In operation, the susceptor controlsubroutine 450 controls movement of the susceptor 12 in response toprocess set parameters that are transferred from the chamber managersubroutine 440.

[0064] The process gas control subroutine 460 has program code forcontrolling process gas composition and flow rates. The process gascontrol subroutine 460 controls the open/close position of the safetyshut-off valves, and also ramps up/down the mass flow controllers toobtain the desired gas flow rate. The process gas control subroutine 460is invoked by the chamber manager subroutine 440, as are all chambercomponents subroutines, and receives from the chamber manager subroutineprocess parameters related to the desired gas flow rates. Typically, theprocess gas control subroutine 460 operates by opening the gas supplylines, and repeatedly (i) reading the necessary mass flow controllers,(ii) comparing the readings to the desired flow rates received from thechamber manager subroutine 440, and (iii) adjusting the flow rates ofthe gas supply lines as necessary. Furthermore, the process gas controlsubroutine 460 includes steps for monitoring the gas flow rates forunsafe rates, and activating the safety shut-off valves when an unsafecondition is detected.

[0065] In some processes, an inert gas such as helium or argon is flowedinto the reactor 10 to stabilize the pressure in the chamber beforereactive process gases are introduced into the chamber. For theseprocesses, the process gas control subroutine 460 is programmed toinclude steps for flowing the inert gas into the chamber 10 for anamount of time necessary to stabilize the pressure in the chamber, andthen the steps described above would be carried out. Additionally, whena process gas is to be vaporized from a liquid precursor, for example1,3,5-trisilano-2,4,6-trimethylene (1,3,5-trisilanacyclo-hexane), theprocess gas control subroutine 460 would be written to include steps forbubbling a delivery gas such as helium through the liquid precursor in abubbler assembly. For this type of process, the process gas controlsubroutine 460 regulates the flow of the delivery gas, the pressure inthe bubbler, and the bubbler temperature in order to obtain the desiredprocess gas flow rates. As discussed above, the desired process gas flowrates are transferred to the process gas control subroutine 460 asprocess parameters. Furthermore, the process gas control subroutine 460includes steps for obtaining the necessary delivery gas flow rate,bubbler pressure, and bubbler temperature for the desired process gasflow rate by accessing a stored table containing the necessary valuesfor a given process gas flow rate. Once the necessary values areobtained, the delivery gas flow rate, bubbler pressure and bubblertemperature are monitored, compared to the necessary values and adjustedaccordingly.

[0066] The pressure control subroutine 470 comprises program code forcontrolling the pressure in the reactor 10 by regulating the size of theopening of the throttle valve in the exhaust pump 32. The size of theopening of the throttle valve is set to control the chamber pressure tothe desired level in relation to the total process gas flow, size of theprocess chamber, and pumping set point pressure for the exhaust pump 32.When the pressure control subroutine 470 is invoked, the desired, ortarget pressure level is received as a parameter from the chambermanager subroutine 440. The pressure control subroutine 470 operates tomeasure the pressure in the reactor 10 by reading one or moreconventional pressure manometers connected to the chamber, compare themeasure value(s) to the target pressure, obtain PID (proportional,integral, and differential) values from a stored pressure tablecorresponding to the target pressure, and adjust the throttle valveaccording to the PID values obtained from the pressure table.Alternatively, the pressure control subroutine 470 can be written toopen or close the throttle valve to a particular opening size toregulate the reactor 10 to the desired pressure.

[0067] The heater control subroutine 480 comprises program code forcontrolling the temperature of the heat modules or radiated heat that isused to heat the susceptor 12. The heater control subroutine 480 is alsoinvoked by the chamber manager subroutine 440 and receives a target, orset point, temperature parameter. The heater control subroutine 480measures the temperature by measuring voltage output of a thermocouplelocated in a susceptor 12, compares the measured temperature to the setpoint temperature, and increases or decreases current applied to theheat module to obtain the set point temperature. The temperature isobtained from the measured voltage by looking up the correspondingtemperature in a stored conversion table, or by calculating thetemperature using a fourth order polynomial. The heater controlsubroutine 480 gradually controls a ramp up/down of current applied tothe heat module. The gradual ramp up/down increases the life andreliability of the heat module. Additionally, a built-in-fail-safe modecan be included to detect process safety compliance, and can shut downoperation of the heat module if the reactor 10 is not properly set up.

[0068] The plasma control subroutine 490 comprises program code forsetting the RF bias voltage power level applied to the processelectrodes in the reactor 10, and optionally, to set the level of themagnetic field generated in the reactor. Similar to the previouslydescribed chamber component subroutines, the plasma control subroutine490 is invoked by the chamber manager subroutine 440.

[0069] The above CVD system description is mainly for illustrativepurposes, and other plasma CVD equipment such as electrode cyclotronresonance (ECR) plasma CVD devices, induction-coupled RF high densityplasma CVD devices, or the like may be employed. Additionally,variations of the above described system such as variations in susceptordesign, heater design, location of RF power connections and others arepossible. For example, the wafer could be supported and heated by aresistively heated susceptor. The pretreatment and method for forming apretreated layer of the present invention is not limited to any specificapparatus or to any specific plasma excitation method.

Deposition of the Oxidized Organosilane or Organosiloxane Dielectric ina Three-Layer Gap Filling Process

[0070] The oxidized organosilane or organosiloxane layer of the presentinvention can be used in a three-layer gap filling process as shown inFIG. 5 using the PECVD chamber of FIG. 2. Referring to FIG. 5, a waferis positioned 200 in the reactor 10 and an oxidized organosilane layerhaving a low dielectric constant is deposited 205 by a PECVD processfrom a plasma comprising an organosilane compound and/or aorganosiloxane compound. The deposition step 205 can include acapacitively coupled plasma or both an inductively and a capacitivelycoupled plasma in the process chamber 15 according to methods known inthe art. An inert gas such as helium is commonly used in the PECVDdeposition to assist in plasma generation. A gap fill layer is thendeposited 210 on the liner layer by known methods. The gap fill layer ispreferably self-planarizing, such as spin-on polymers or oxidesdeposited in liquid form by reaction of methyl silane and hydrogenperoxide. A cap layer is then deposited 215 on the gap fill layer,preferably using the same process for depositing the lining layer. Thewafer is then removed 220 from the reactor 10.

[0071] Referring to FIGS. 6A-6E, the three-layer gap filling processprovides a PECVD lining layer 300 of the oxidized organosilane ororganosiloxane polymer. The lining layer 300 acts as an isolation layerbetween a subsequent gap fill layer 302 and the underlying substratesurface 304 and metal lines 306, 308, 310 formed on the substratesurface. The gap fill layer 302 is capped by a PECVD capping layer 312of the oxidized organosilane or organosiloxane polymer. This process isimplemented and controlled using a computer program stored in the memory38 of a computer controller 34 for a CVD reactor 10.

[0072] Referring to FIG. 6A, the PECVD lining layer 300 is deposited inthe reactor 10 by introducing an oxidizing gas such as N₂O, anorganosilane or organosiloxane compound such as CH₃SiH₃ or (CH₃)₂SiH₂,and a carrier gas such as helium. The substrate is maintained at atemperature of from about −20° C. to about 400° C., and preferably ismaintained at a temperature of approximately −20° C. to 40° C.throughout the deposition of the PECVD lining layer. The PECVD lininglayer 300 is deposited with a process gas that includes a mixture of theorganosilane and/or organosiloxane compound at a flow rate of about 5sccm to about 500 sccm and the oxidizing gas at a flow rate of about 5sccm to about 2000 sccm. The process gases are carried by an inert gassuch He, Ar, Ne, or a relatively inert gas such as nitrogen, which aretypically not incorporated into the film, at a flow rate of from about0.2 to about 20 lpm. The process gases react at a pressure from about0.2 to about 20 Torr, preferably less than 10 Torr, to form a conformalsilicon oxide layer on the substrate surface 304 and metal lines 306,308, 310. The reaction is plasma enhanced with a power density rangingfrom 0.05 W/cm² to 1000 W/cm², preferably a power density less thanabout 1 W/cm², most preferably a power density ranging from about 0.1 toabout 0.3 W/cm².

[0073] For an 8″ single wafer chamber, the high frequency RF source ofapproximately 13.56 MHz is preferably connected to a gas distributionsystem and driven at about 10 to about 500 W while a low frequency RFsource of about 350 KHz to 1 MHz is optionally connected to a susceptorand driven at about 0 to about 100 W. In a preferred embodiment, thehigh frequency RF source is driven at about 20 W to about 250 W ofpulsed RF power, and the low frequency RF source is driven at about 0 toabout 50 W of pulsed RF power at a duty cycle from 10% to 30%. Thepulsed RF power is preferably cycled in short intervals, most preferablyhaving a frequency less than about 200 Hz. When the high frequency RFpower is constant, the power level preferably ranges from about 20 W toabout 100 W.

[0074] The oxidized organosilane or organosiloxane layer is then curedat a pressure less than about 10 Torr a temperature from about 100° C.to about 450° C. Optionally, curing could be conducted after depositionof additional dielectric layers.

[0075] The above process conditions result in the deposition of a PECVDlining layer 300 (at about 2000 Å per minute) with improved barriercharacteristics for the subsequent deposition of the gap filling layer302 shown in FIG. 6B. The lining layer obtained from methylsilane hassufficient C—H bonds to be hydrophobic, and is an excellent moisturebarrier. Deposition of a hydrophobic lining layer has a surprising andunexpected result of converting subsequent hydrophilic layers tohydrophobic layers.

[0076] The process gases for the gap filling layer 302 are preferablySiH₄, CH₃SiH₃, or (CH₃)₂SiH₂ and 50 wt % of hydrogen peroxide (H₂O₂)which is vaporized and mixed with an inert carrier gas, such as helium.However, the gap filling layer can be any dielectric layer which has anacceptable dielectric constant. Alternative silicon containing compoundscan be used if byproducts are vapors at deposition conditions. Preferredalternative compounds incorporate oxysilano or silano groups, such as:

[0077] trimethylsilane,

[0078] disilanomethane,

[0079] bis(methylsilano)methane,

[0080] 1,2-disilanoethane,

[0081] 2,2-disilanopropane,

[0082]1,3,5-trisilano-2,4,6-trimethylene(cyclic),

[0083] 1,3-bis(silanomethylene)siloxane,

[0084] bis(1-methyldisiloxanyl)methane,

[0085] 1,3,5,7-tetramethylcyclotetrasiloxane, or

[0086] 1,2-disilanotetrafluoroethane.

[0087] The process gas flows range from 0-2000 sccm for He, 10-200 sccmfor CH₃SiH₃, and 0.1 to 3 g/min. for H₂O₂. The preferred gas flows rangefrom 100-500 sccm for He, 20-100 sccm for CH₃SiH₃, and 0.1 to 1 g/min.for H₂O₂. These flow rates are given for a chamber having a volume ofapproximately 5.5 to 6.5 liters. Preferably, reactor 10 is maintained ata pressure of about 0.2 to about 5 torr during deposition of the gapfilling layer 302. The gap filling layer 302 may be partially cured asshown in FIG. 6C to remove solvents such as water prior to deposition ofa cap layer 312 as shown in FIG. 6D. Curing is done in the reactor 10 bypumping under an inert gas atmosphere under 10 Torr.

[0088] Gap filling layers produced from methylsilane are typicallyhydrophilic and have poor moisture barrier properties. When deposited ona lining layer produced from methylsilane, a gap filling layer producedfrom methylsilane surprisingly is hydrophobic and has good moisturebarrier properties.

[0089] Referring to FIG. 6D, after deposition of the gap filling layer302, the reactor 10 optionally resumes deposition of the oxidizedorganosilane or organosiloxane layer of the present invention fordeposition of a capping layer 312. Referring to FIG. 6E, afterdeposition of the capping layer, if any, the deposited layers are curedin a furnace or another chamber at a temperature from about 100° C. toabout 450° C. to drive off remaining solvent or water. Of course,processing conditions will vary according to the desired characteristicsof the deposited films.

Deposition of a Dual Damascene Structure

[0090] A dual damascene structure which includes an oxidizedorganosilane or organosiloxane layers as an etch stop or as anintermetal dielectric layer is shown in FIG. 7. When the oxidizedorganosilane or organosiloxane is used as an etch stop, a firstdielectric layer 510 is deposited on a substrate 512 and then theoxidized organosilane or organosiloxane etch stop 514 is deposited onthe first dielectric layer and cured. The etch stop is then patternetched to define the openings of the contacts/vias 516. A seconddielectric layer 518 is then deposited over the patterned etch stop andthen pattern etched by conventional methods to define the interconnectlines 520. A single etch process is then performed to define theinterconnects down to the etch stop and to etch the unprotecteddielectric exposed by the patterned etch stop to define thecontacts/vias.

[0091] Referring again to FIG. 7, the damascene structure alternativelyincludes the oxidized organosilane or organsiloxane as an intermetaldielectric. A first dielectric layer 510, preferably consisting of theoxidized organosilane or organosiloxane, is deposited on a substrate 512and then a conventional silicon oxide, silicon nitride, or hydrogenatedsilicon carbide etch stop 514 is deposited on the first dielectriclayer. The etch stop is then patterned to define the openings of thecontacts/vias 516. A second dielectric layer 518, consisting of theoxidized organosilane or organosiloxane, is then deposited over thepatterned etch stop and then patterned to define the interconnect lines520. A single etch process is then performed to define the interconnectsdown to the etch stop and to etch the unprotected dielectric exposed bythe patterned etch stop to define the contacts/vias.

[0092] A preferred dual damascene structure fabricated in accordancewith the invention includes a lining layer as shown in FIG. 8H, and themethod of making the structure is sequentially depicted schematically inFIGS. 8A-8H, which are cross sectional views of a substrate having thesteps of the invention formed thereon.

[0093] As shown in FIG. 8A, an initial first dielectric layer 510, suchas parylene, FSG, silicon oxide, or the like, is deposited on thesubstrate 512 to a thickness of about 5,000 to about 10,000 Å, dependingon the size of the structure to be fabricated. As shown in FIG. 8B, thelow k etch stop 514, which is the oxidized organosilane ororganosiloxane layer, is then deposited on the first dielectric layer toa thickness of about 200 to about 1000 Å using low levels of RF power.The low k etch stop 514 is then pattern etched to define the contact/viaopenings 516 and to expose first dielectric layer 510 in the areas wherethe contacts/vias are to be formed as shown in FIG. 8C. Preferably, lowk etch stop 514 is pattern etched using conventional photolithographyand etch processes using fluorine, carbon, and oxygen ions. After low ketch stop 514 has been etched to pattern the contacts/vias and the photoresist has been removed, a second dielectric layer 518 is deposited overetch stop 514 to a thickness of about 5,000 to about 10,000 Å as shownin FIG. 8D. A second dielectric layer 518 is then patterned to defineinterconnect lines 520, preferably using conventional photolithographyprocesses with a photo resist layer 522 as shown in FIG. 8E. Theinterconnects and contacts/vias are then etched using reactive ionetching or other anisotropic etching techniques to define themetallization structure (i.e., the interconnect and contact/via) asshown in FIG. 8F. Any photo resist or other material used to pattern theetch stop 514 or the second dielectric layer 518 is removed using anoxygen strip or other suitable process.

[0094] The metallization structure is then formed with a conductivematerial such as aluminum, copper, tungsten or combinations thereof.Presently, the trend is to use copper to form the smaller features dueto the low resistivity of copper (1.7 μΩ-cm compared to 3.1 μΩ-cm foraluminum). Preferably, as shown in FIG. 8G, a suitable barrier layer 524such as tantalum nitride is first deposited conformally in themetallization pattern to prevent copper migration into the surroundingsilicon and/or dielectric material. Thereafter, copper 526 is depositedusing either chemical vapor deposition, physical vapor deposition,electroplating, or combinations thereof to form the conductivestructure. Once the structure has been filled with copper or othermetal, the surface is planarized using chemical mechanical polishing, asshown in FIG. 8H.

Deposition of Adhesive Layers

[0095] A dual damascene structure which includes an oxidizedorganosilane or organosiloxane layer as an adhesive layer between apremetal dielectric layer and an intermetal dielectric layer is shown inFIG. 9. The oxidized organosilane or organosiloxane adhesive layer 612is deposited on a premetal dielectric layer 610 such as a conventionalPSG or BPSG layer and then cured. An intermetal dielectric layer 614,preferably a low k dielectric polymer layer, is then deposited over theadhesive layer 612. A conventional silicon oxide or silicon nitride etchstop 616 is then patterned by conventional methods to define vias 620. Asecond intermetal dielectric layer 622, preferably the low k dielectricpolymer, is then deposited over the patterned etch stop and thenpatterned to define the interconnect lines. A single etch process isthen performed to define the interconnects down to the etch stop and toetch the unprotected dielectric exposed by the patterned etch stop todefine the contacts/vias prior to metallization.

[0096] A preferred dual damascene structure comprising an adhesive layerin accordance with the invention is shown in FIG. 10H, and the method ofmaking the structure is sequentially depicted schematically in FIGS.10A-10H, which are cross sectional views of a substrate having the stepsof the invention formed thereon.

[0097] As shown in FIG. 10A, an initial first intermetal dielectriclayer 710, such as parylene, FSG, silicon oxide, or the like, isdeposited on a substrate 712 to a thickness of about 5,000 to about10,000 Å, depending on the size of the structure to be fabricated. Asshown in FIG. 10B, a low k adhesive layer 714, which is the oxidizedorgano silane layer, is then deposited on the first intermetaldielectric layer 710 to a thickness of about 50 to about 200 Å. Aconventional silicon oxide or silicon nitride etch stop 716 is thedeposited on the adhesive layer 714 to a thickness of about 50 to about200 Å. A second low k adhesive layer 718, which is the oxidized organosilane layer, is then deposited on the etch stop 716 to a thickness ofabout 50 to about 200 Å. The etch stop 716 and adhesive layers 714, 718are then pattern etched to define the contact/via openings 720 and toexpose first intermetal dielectric layer 710 in the areas where thecontacts/vias are to be formed as shown in FIG. 10C. Preferably, theetch stop 716 is pattern etched using conventional photolithography andetch processes using fluorine, carbon, and oxygen ions. After the etchstop 716 and adhesive layers 714, 718 have been etched to pattern thecontacts/vias and the photo resist has been removed, a second intermetaldielectric layer 722 is deposited over second adhesive layer 718 to athickness of about 5,000 to about 10,000 Å as shown in FIG. 10D. Thesecond intermetal dielectric layer 722 is then patterned to defineinterconnect lines 724, preferably using conventional photolithographyprocesses with a photo resist layer 726 as shown in FIG. 10E. Theinterconnects and contacts/vias are then etched using reactive ionetching or other anisotropic etching techniques to define themetallization structure (i.e., the interconnect and contact/via) asshown in FIG. 10F. Any photo resist or other material used to patternthe etch stop 716 or the second intermetal dielectric layer 722 isremoved using an oxygen strip or other suitable process.

[0098] The metallization structure is then formed with a conductivematerial such as aluminum, copper, tungsten or combinations thereof.Presently, the trend is to use copper to form the smaller features dueto the low resistivity of copper (1.7 μΩ-cm compared to 3.1 μΩ-cm foraluminum). Preferably, as shown in FIG. 10G, a suitable barrier layer728 such as tantalum nitride is first deposited conformally in themetallization pattern to prevent copper migration into the surroundingsilicon and/or dielectric material. Thereafter, copper is depositedusing either chemical vapor deposition, physical vapor deposition,electroplating, or combinations thereof to form the conductivestructure. Once the structure has been filled with copper or othermetal, the surface is planarized using chemical mechanical polishing, asshown in FIG. 10H.

Dual Damascene Integration

[0099] Another preferred dual damascene structure comprises siliconoxide layers having different dielectric constants to resist crosstalkbetween layers, and is deposited as shown in FIGS. 11A-11D, which arecross sectional views of a substrate having the steps of the inventionformed thereon.

[0100] As shown in FIG. 11A, a via level dielectric layer 810, having acarbon content greater than 20% by atomic weight, is deposited on asubstrate 812 to a thickness of about 5,000 to about 10,000 Å, dependingon the size of the structure to be fabricated. The via level dielectriclayer is preferably deposited by reacting N₂O and trimethylsilane at anRF power level of 500 W with a duty cycle of 10%. As shown in FIG. 11A,the via level dielectric level is then pattern etched to form the viasand contact holes 814 with conventional photolithography and etchprocesses for high carbon materials using fluorine, carbon, and oxygenions.

[0101] As shown in FIG. 11B, trench level dielectric layer 822 having acarbon content less than 10% by atomic weight, is deposited over the vialevel dielectric layer 810 to a thickness of about 5,000 to about 10,000Å. The trench level dielectric layer is preferably deposited by reactingN₂O and methylsilane at an RF power level of 500 W with a duty cycle of30%. The trench level dielectric layer 822 is then pattern etched todefine interconnect lines 824 as shown in FIG. 11B, using conventionalphotolithography processes and etch processes that are effective for lowcarbon materials and not effective for high carbon materials. Any photoresist or other material used to pattern the dielectric layers isremoved using chemical mechanical polishing, an oxygen strip, or othersuitable process.

[0102] The metallization structure is then formed with a conductivematerial such as aluminum, copper, tungsten or combinations thereof.Presently, the trend is to use copper to form the smaller features dueto the low resistivity of copper (1.7 μΩ-cm compared to 3.1 μΩ-cm foraluminum). Preferably, as shown in FIG. 11C, a suitable barrier layer828 such as tantalum nitride is first deposited conformally in themetallization pattern to prevent copper migration into the surroundingsilicon and/or dielectric material. Thereafter, copper 830 is depositedas shown in FIG. 11D using either chemical vapor deposition, physicalvapor deposition, electroplating, or combinations thereof to form theconductive structure. Once the structure has been filled with copper orother metal, the surface is planarized using chemical mechanicalpolishing or other planarizing methods.

[0103] The invention is further described by the following examples.

EXAMPLE

[0104] The following example and demonstrates deposition of an oxidizedorganosilane or organosiloxane film having excellent barrier andadhesion properties. This example was undertaken using a chemical vapordeposition chamber, and in particular, a “CENTURA DxZ” system whichincludes a solid-state RF matching unit with a two-piece quartz processkit, both fabricated and sold by Applied Materials, Inc., Santa Clara,Calif.

Non-Pulsed RF Power

[0105] An oxidized dimethylsilane film was deposited at a chamberpressure of 3.0 Torr and temperature of 15° C. from reactive gases whichwere flowed into the reactor as follows: Dimethylsilane, (CH₃)₂SiH₂, at 55 sccm Nitrous oxide, N₂O, at  300 sccm Helium, He, at 4000 sccm.

[0106] The substrate was positioned 600 mil from the gas distributionshowerhead and 20 W of high frequency power (13 MHz) was applied to theshowerhead for plasma enhanced deposition of an oxidized dimethylsilanelayer. The oxidized dimethylsilane material had a dielectric constant ofabout 2.5 and was hydrophobic.

HYPOTHETICAL EXAMPLES

[0107] The following hypothetical examples describe deposition of anoxidized organosilane or organosiloxane film of the present invention.These examples are written for the chemical vapor deposition chamberdescribed in the prior example.

Pulsed RF Power

[0108] An oxidized 1,3,5-trisilano-2,4,6-trimethylene (cyclic) film isdeposited at a chamber pressure of 3.0 Torr and temperature of 15° C.from reactive gases which flow into the reactor as follows:1,3,5-trisilano-2,4,6-trimethylene, SiH₂CH₂₃ (cyclic), at  20 sccmNitrous oxide, N₂O, at  300 sccm Helium, He, at 4000 sccm.

[0109] The substrate is positioned 600 mil from the gas distributionshowerhead and 50 W of pulsed high frequency power (13 MHz) is appliedto the showerhead for plasma enhanced deposition of an oxidized1,3,5-trisilano-2,4,6-trimethylene layer

Pulsed RF Power

[0110] An oxidized 1,3-dimethyidisiloxane film is deposited at a chamberpressure of 3.0 Torr and temperature of 15° C. from reactive gases whichare flowed into the reactor as follows: 1,3-Dimethyldisiloxane,CH₃—SiH₂—O—SiH₂—CH₃, at  30 sccm Nitrous oxide, N₂O, at  300 sccmHelium, He, at 4000 sccm.

[0111] The substrate is positioned 600 mil from the gas distributionshowerhead and 50 W of pulsed high frequency RF power (13 MHz) isapplied to the showerhead for plasma enhanced deposition of an oxidizeddimethyldisiloxane layer.

Microwave/RF Power

[0112] An oxidized 1,3-dimethyldisiloxane film is deposited at a chamberpressure of 3.0 Torr and temperature of 15° C. from reactive gases whichare flowed into the reactor as follows: 1,3-Dimethyldisiloxane,CH₃—SiH₂—O—SiH₂—CH₃, at  30 sccm Nitrous oxide, N₂O, at  300 sccmHelium, He, at 4000 sccm.

[0113] Prior to entering the chamber, the nitrous oxide is dissociatedin a microwave applicator that provides 2000 W of microwave energy. Thesubstrate is positioned 600 mil from the gas distribution showerhead and50 W of high frequency RF power (13 MHz) is applied to the showerhead incycles for plasma enhanced deposition of an oxidized dimethyldisiloxanelayer. Each cycle provides RF power for 30% of the cycle.

[0114] While the foregoing is directed to preferred embodiments of thepresent invention, other and further embodiments of the invention may bedevised without departing from the basic scope thereof, and the scopethereof is determined by the claims which follow.

What is claimed is:
 1. A method for depositing a low dielectric constantfilm on a substrate, comprising reacting two or more organosiloxanes,wherein at least one of the organosiloxanes is a cyclic organosiloxanecomprising C, H, and O, while applying RF power, wherein the lowdielectric constant film comprises silicon-carbon bonds and a dielectricconstant of about 3 or less.
 2. The method of claim 1, wherein the atleast one cyclic organosiloxane comprising C, H, and O comprises a ringcomprising oxygen.
 3. The method of claim 2, wherein the at least onecyclic organosiloxane comprising C, H, and O is selected from the groupconsisting of 1,3,5,7-tetramethylcyclotetrasiloxane andoctamethylcyclotetrasiloxane.
 4. The method of claim 1, wherein the twoor more organosiloxanes are selected from the group consisting of1,3,5,7-tetramethylcyclotetrasiloxane, octamethylcyclotetrasiloxane,1,3,5,7,9-pentamethylcyclopentasiloxane, and1,3,5,7-tetrasilano-2,6-dioxy-4,8-dimethylene.
 5. The method of claim 1,wherein the two or more organosiloxanes are reacted with an oxidizinggas.
 6. The method of claim 5, wherein the oxidizing gas is selectedfrom the group consisting of oxygen, ozone, nitrous oxide, carbondioxide, and water.
 7. The method of claim 1, wherein the RF power ispulsed to increase the porosity of the film.
 8. A method for depositinga low dielectric constant film on a substrate, comprising reacting twoor more organosilanes, wherein at least one of the organosilanes is acyclic organosilane, while applying RF power, wherein the low dielectricconstant film comprises silicon-carbon bonds and a dielectric constantof about 3 or less.
 9. The method of claim 8, wherein the cyclicorganosilane is 1,3,5-trisilano-2,4,6-trimethylene.
 10. The method ofclaim 9, wherein the two or more organosilanes further comprise anorganosilane selected from the group consisting of methylsilane,dimethylsilane, trimethylsilane, dimethylsilanediol, ethylsilane,phenylsilane, diphenylsilane, diphenylsilanediol, methylphenylsilane,disilanomethane, bis(methylsilano)methane, 1,2-disilanoethane,1,2-bis(methylsilano)ethane, and 2,2-disilanopropane.
 11. The method ofclaim 8, wherein the two or more organosilanes are reacted with anoxidizing gas.
 12. The method of claim 11, wherein the oxidizing gas isselected from the group consisting of oxygen, ozone, nitrous oxide,carbon dioxide, and water.
 13. The method of claim 8, wherein the RFpower is pulsed to increase the porosity of the film.
 14. The method ofclaim 8, wherein at least one of the two or more organosilanes comprisesoxygen.
 15. A method for depositing a low dielectric constant film on asubstrate, comprising reacting two or more organosiloxanes, wherein afirst organosiloxane of the two or more organosiloxanes is cyclic andcomprises C, H, and O and a ring comprising carbon and oxygen, whileapplying RF power, wherein the low dielectric constant film comprisessilicon-carbon bonds and a dielectric constant of about 3 or less. 16.The method of claim 15, wherein the first organosiloxane is1,3,5,7-tetrasilano-2,6-dioxy-4,8-dimethylene.
 17. The method of claim15, wherein a second organosiloxane of the two or more organosiloxanesis selected from the group consisting of 1,3-dimethyldisiloxane,1,1,3,3-tetramethyldisiloxane, hexamethyldisiloxane,1,3-bis(silanomethylene)disiloxane, bis(1-methyidisiloxanyl)methane,2,2-bis(1-methyldisiloxanyl)propane,1,3,5,7-tetramethylcyclotetrasiloxane, octamethylcyclotetrasiloxane, and1,3,5,7,9-pentamethylcyclopentasiloxane.
 18. The method of claim 15,wherein the two or more organosiloxanes are reacted with an oxidizinggas.
 19. The method of claim 18, wherein the oxidizing gas is selectedfrom the group consisting of oxygen, ozone, nitrous oxide, carbondioxide, and water.
 20. The method of claim 15, wherein the RF power ispulsed to increase the porosity of the film.